| Commit message (Expand) | Author | Age | Files | Lines | |
|---|---|---|---|---|---|
| * | devtest: Fixed case where B200 test could fail due to bad params | Martin Braun | 2016-03-25 | 1 | -1/+1 |
| * | devtest: Backed out fast B2X0 rate tests so we can use the same test on USB2 | Martin Braun | 2016-03-25 | 1 | -24/+24 |
| * | tests: More devtests, works on E3XX now | Martin Braun | 2015-11-11 | 1 | -1/+1 |
| * | tests: Added first batch of device tests | Martin Braun | 2015-10-07 | 1 | -0/+76 |
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