Commit message (Collapse) | Author | Age | Files | Lines | |
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* | devtest: Fixed case where B200 test could fail due to bad params | Martin Braun | 2016-03-25 | 1 | -1/+1 |
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* | devtest: Backed out fast B2X0 rate tests so we can use the same test on USB2 | Martin Braun | 2016-03-25 | 1 | -24/+24 |
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* | tests: More devtests, works on E3XX now | Martin Braun | 2015-11-11 | 1 | -1/+1 |
| | | | | | | | - devtest now gets installed - uhd_usrp_probe test - Added make test_e3xx - Minor fixes to previous devtests | ||||
* | tests: Added first batch of device tests | Martin Braun | 2015-10-07 | 1 | -0/+76 |
- Currently supported: B2xx, X3x0 - Runs some simple examples |