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author | Martin Braun <martin.braun@ettus.com> | 2016-12-14 16:00:19 -0800 |
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committer | Martin Braun <martin.braun@ettus.com> | 2017-01-17 13:11:34 -0800 |
commit | cfec002bb2a342670e744c8f699926c0b599c12d (patch) | |
tree | d1970b95e563d6e5e008202c230c6688fa6670e0 /host/docs/rd_testing.dox | |
parent | 27f2d44eb0cf2a0cb103bd2f8821d66c77c3a851 (diff) | |
download | uhd-cfec002bb2a342670e744c8f699926c0b599c12d.tar.gz uhd-cfec002bb2a342670e744c8f699926c0b599c12d.tar.bz2 uhd-cfec002bb2a342670e744c8f699926c0b599c12d.zip |
docs: Added devtest test procedure
Diffstat (limited to 'host/docs/rd_testing.dox')
-rw-r--r-- | host/docs/rd_testing.dox | 87 |
1 files changed, 87 insertions, 0 deletions
diff --git a/host/docs/rd_testing.dox b/host/docs/rd_testing.dox index 9c712b084..d40a7ccb9 100644 --- a/host/docs/rd_testing.dox +++ b/host/docs/rd_testing.dox @@ -65,6 +65,93 @@ All of these tests must pass for a 'pass' validation. tbd + +\section rdtesting_devtest Devtests + +| Test Code | Device | Peripherals | Manual Test Procedure | Automatic Test Procedure | +|---------------------|---------------|-------------|-------------------------------|-----------------------------| +| DEVTEST-X310-XG-v1 | USRP X310 | None | \ref rdtesting_devtest_manual | \ref rdtesting_devtest_auto | +| DEVTEST-X310-HG-v1 | USRP X310 | None | \ref rdtesting_devtest_manual | \ref rdtesting_devtest_auto | +| DEVTEST-X300-XG-v1 | USRP X300 | None | \ref rdtesting_devtest_manual | \ref rdtesting_devtest_auto | +| DEVTEST-X300-HG-v1 | USRP X300 | None | \ref rdtesting_devtest_manual | \ref rdtesting_devtest_auto | +| DEVTEST-E310-SG1-v1 | USRP E310-SG1 | None | \ref rdtesting_devtest_manual | \ref rdtesting_devtest_auto | +| DEVTEST-E310-SG3-v1 | USRP E310-SG3 | None | \ref rdtesting_devtest_manual | \ref rdtesting_devtest_auto | +| DEVTEST-B200-v1 | USRP B200 | None | \ref rdtesting_devtest_manual | \ref rdtesting_devtest_auto | +| DEVTEST-B210-v1 | USRP B210 | None | \ref rdtesting_devtest_manual | \ref rdtesting_devtest_auto | +| DEVTEST-B200m-v1 | USRP B200mini | None | \ref rdtesting_devtest_manual | \ref rdtesting_devtest_auto | +| DEVTEST-B205m-v1 | USRP B205mini | None | \ref rdtesting_devtest_manual | \ref rdtesting_devtest_auto | + +The devtests are hardware tests built in to the UHD make system. They can be run +directly from the build directory and require no configuration. +Devtests are designed to always run, regardless of the actual device +configuration. This means, by definition, that devtests cannot require special +cabling, specific daughtercards, etc. + +Note: The actual devtests can change, since they're part of the code. This does +not require a version bump on the test code. + +\subsection rdtesting_devtest_requirements Requirements + +Devtests are only defined for some devices. When running a devtest, all +peripherals must be disconnected (e.g., no daughterboards on the X-Series, no +GPSDOs on the B- and X-Series). + +\subsection rdtesting_devtest_manual Devtest: Manual Test Procedure + +### X3x0 procedure + +1. Make sure no peripherals are connected to the device (no daughterboards, no + GSPDO, front panel GPIO is unconnected). +2. When testing the HG image, run a test once for each connection (1 GigE and + 10 GigE). When testing the XG image, a test on either connection (SFP0 or + SFP1) is sufficient. In both cases, also test via PCIe. +3. When the device is connected, simply run `make test_x3x0` from the command + line in the build directory. Multiple devices connected will all get tested, + there is no requirement to only connect a single device at a time (because + devtest will run sequentially anyway). +4. Devtest must report no failures for a 'pass' validation. + +### B2xx procedure + +Note: The test codes with an 'm' suffix refer to B200mini and B205mini, +respectively. + +1. Make sure no peripherals are connected to the device (no GPSDO if applicable, + GPIO pins unconnected) +2. Test once via USB3, once via USB2. +3. Simply run `make test_b2xx` +4. Devtest must report no failures for a 'pass' validation. + +### E310 procedure + +1. Make sure GPIO pins are unconnected. +2. Tests need to be run natively on the device. If the build environment is + available on the device, running `make test_e3xx` is sufficient. +3. In general, there is no build environment on the device (e.g. when doing a + typical sshfs mount of an environment). In this case, copy the contents of + the devtest directory onto the device, and run the following command (the + environment variables need to point to the location of the devtest code, the + location of the UHD examples such as benchmark_rate, and where you want to + store log files, respectively): + + $DEVTEST_DIR/run_testsuite.py --src-dir $DEVTEST_DIR \ + --devtest-pattern e3xx \ + --build-type na \ + --build-dir $EXAMPLES_DIR \ + --device-filter e3x0 \ + --log-dir $LOG_DIR + +4. Devtest must report no failures for a 'pass' validation. +5. This bullet point needs to be removed and is here to see if people are + actually reviewing this. Easter egg! First person to flag this gets a + surprise. + +\subsection rdtesting_devtest_auto Devtest: Automatic Test Procedure + +As all these tests can be run unsupervised, they can be run automatically given +the correct device setup. The return code of the tests can be used to check for +pass/fail conditions (return code 0 means 'pass'). + \section rdtesting_defining Defining R&D Tests Tests can be added any time to define procedures for pass/fail validation. Any |